MCB -- Index by Author (Feb 2002; Volume 22, Number 4)

Index by Author: Feb 2002; 22 (4) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Ai, Wandong [Abstract] [Full Text]; Akatsuka, Hiroyuki [Abstract] [Full Text]; Alcid, Alston D. [Abstract] [Full Text]; Appella, Ettore [Abstract] [Full Text]; Aulner, Nathalie [Abstract] [Full Text]; Autexier, Chantal [Abstract] [Full Text]; Avraham, Hava [Abstract] [Full Text]
B: Bashour, Anne-Marie [Abstract] [Full Text]; Beems, Rudolph B. [Abstract] [Full Text]; Behrens, Jürgen [Abstract] [Full Text]; Berger, James M. [Abstract] [Full Text]; Bertram, Paula G. [Abstract] [Full Text]; Birchmeier, Walter [Abstract] [Full Text]; Bourgeois, Cyril F. [Abstract] [Full Text]; Bradley, Allan [Abstract] [Full Text]; Brayton, Cory [Abstract] [Full Text]; Bu, Xia [Abstract] [Full Text]; Bulavin, Dmitry V. [Abstract] [Full Text]
C: Cao, Renhai [Abstract] [Full Text]; Cao, Yihai [Abstract] [Full Text]; Carvalho, John [Abstract] [Full Text]; Catez, Frédéric [Abstract] [Full Text]; Chan, Richard [Abstract] [Full Text]; Chan, Ting-Fung [Abstract] [Full Text]; Choi, Jae H. [Abstract] [Full Text]; Choi, Jene [Abstract] [Full Text]; Choi, Yongwon [Full Text]; Churcher, Mark J. [Abstract] [Full Text]; Clevers, Hans [Abstract] [Full Text]; Cooney, Austin [Abstract] [Full Text]; Costantini, Frank [Abstract] [Full Text]; Cuvier, Olivier [Abstract] [Full Text]
D: Demidov, Oleg N. [Abstract] [Full Text]; Diaz, Jean-Jacques [Abstract] [Full Text]; Diaz, Robert L. [Abstract] [Full Text]; Domon, Claire [Abstract] [Full Text]; Donehower, Lawrence A. [Abstract] [Full Text]; Dupuis, Sophie [Abstract] [Full Text]; Duyster, Justus [Abstract] [Full Text]
E: Erard, Monique [Abstract] [Full Text]
F: Fedorov, Yuri V. [Abstract] [Full Text]; Flavell, Richard A. [Abstract] [Full Text]; Freund, Jean-Noel [Abstract] [Full Text]
G: Gong, Shiaoching [Full Text]; Gorgels, Theo G. M. F. [Abstract] [Full Text]; Grootegoed, J. Anton [Abstract] [Full Text]
H: Hanaoka, Fumio [Abstract] [Full Text]; Hardy, Sarah E. [Abstract] [Full Text]; Hardy, William R. [Abstract] [Full Text]; Hattori, Masakazu [Abstract] [Full Text]; Hoeijmakers, Jan H. J. [Abstract] [Full Text]; Huard, Sylvain [Abstract] [Full Text]
I: Iivanainen, Antti [Abstract] [Full Text]; Imamoto, Akira [Abstract] [Full Text]; Ip, Wallace [Abstract] [Full Text]
J: Jahn, Thomas [Abstract] [Full Text]; Janssen, Sam [Abstract] [Full Text]; Jerchow, Boris [Abstract] [Full Text]; Jho, Eek-hoon [Abstract] [Full Text]; Jones, Nathan C. [Abstract] [Full Text]; Joo, Choun-Ki [Abstract] [Full Text]; Jullien, Denis [Abstract] [Full Text]
K: Karn, Jonathan [Abstract] [Full Text]; Karsten, Uwe [Abstract] [Full Text]; Käs, Emmanuel [Abstract] [Full Text]; Kastan, Michael B. [Abstract] [Full Text]; Katagiri, Koko [Abstract] [Full Text]; Keeney, Scott [Abstract] [Full Text]; Keller, Christian [Abstract] [Full Text]; Kim, Nacksung [Full Text]; Kim, Seong-Tae [Abstract] [Full Text]; Kim, Young Kyeung [Abstract] [Full Text]; Kinashi, Tatsuo [Abstract] [Full Text]; Kindbeiter, Karine [Abstract] [Full Text]; Knippers, Rolf [Abstract] [Full Text]; Kortesmaa, Jarkko [Abstract] [Full Text]
L: Ladenburger, Eva-Maria [Abstract] [Full Text]; Laemmli, Ulrich K. [Abstract] [Full Text]; Laing, Michael A. [Abstract] [Full Text]; Li, Leiming [Abstract] [Full Text]; Li, Xiaoyu [Abstract] [Full Text]; Lim, Bing [Abstract] [Full Text]; Lim, Dae-Sik [Abstract] [Full Text]; Lu, Binfeng [Abstract] [Full Text]; Lustig, Barbara [Abstract] [Full Text]
M: Macara, Ian G. [Abstract] [Full Text]; MacCollin, Mia [Abstract] [Full Text]; Madjar, Jean-Jacques [Abstract] [Full Text]; Mandicourt, Guillaume [Abstract] [Full Text]; Matsumoto, Kunihiro [Abstract] [Full Text]; Mbawuike, Innocent N. [Abstract] [Full Text]; McCulloch, Vicki [Abstract] [Full Text]; Meng, J.-J. [Abstract] [Full Text]; Minato, Nagahiro [Abstract] [Full Text]; Mitchell, John J. [Abstract] [Full Text]; Mizukami, Junko [Abstract] [Full Text]; Monod, Caroline [Abstract] [Full Text]; Moriarty, Tara J. [Abstract] [Full Text]; Morotti, Alessandro [Abstract] [Full Text]; Müller, Markus [Abstract] [Full Text]; Muller, William J. [Abstract] [Full Text]
N: Nannenga, Bonnie [Abstract] [Full Text]; Ng, Jessica M. Y. [Abstract] [Full Text]; Ninomiya-Tsuji, Jun [Abstract] [Full Text]
O: Okura, Masaya [Abstract] [Full Text]; Olwin, Bradley B. [Abstract] [Full Text]; Ooms, Marja P. [Abstract] [Full Text]
P: Peschel, Christian [Abstract] [Full Text]; Pietsch, Torsten [Abstract] [Full Text]; Plafker, Scott M. [Abstract] [Full Text]; Ponzetto, Carola [Abstract] [Full Text]
R: Ratner, Nancy [Abstract] [Full Text]; Ray, Alpana [Abstract] [Full Text]; Ray, Bimal K. [Abstract] [Full Text]; Rho, Jaerang [Full Text]; Risling, Mårten [Abstract] [Full Text]
S: Sachs, Martin [Abstract] [Full Text]; Sakurai, Hiroaki [Abstract] [Full Text]; Sakurai, Naoki [Abstract] [Full Text]; Sall, Alhousseynou [Abstract] [Full Text]; Schaerer-Uthurralt, Nathalie [Abstract] [Full Text]; Schlag, Peter M. [Abstract] [Full Text]; Seidel-Rogol, Bonnie L. [Abstract] [Full Text]; Seipel, Petra [Abstract] [Full Text]; Shadel, Gerald S. [Abstract] [Full Text]; Soininen, Raija [Abstract] [Full Text]; Sorokin, Lydia [Abstract] [Full Text]; Sugasawa, Kaoru [Abstract] [Full Text]; Sun, Xiao Jian [Abstract] [Full Text]
T: Takaesu, Giichi [Abstract] [Full Text]; Thyboll, Jill [Abstract] [Full Text]; Tryggvason, Karl [Abstract] [Full Text]
U: Urschel, Susanne [Abstract] [Full Text]
V: van de Wetering, Marc [Abstract] [Full Text]; van der Horst, Gijsbertus T. J. [Abstract] [Full Text]; Visser, Pim [Abstract] [Full Text]; Vreeburg, Jan T. M. [Abstract] [Full Text]; Vrieling, Harry [Abstract] [Full Text]
W: Wang, Ling [Abstract] [Full Text]; Weiler, Sigrid [Abstract] [Full Text]; West, Michelle J. [Abstract] [Full Text]; Wu, Jiong [Abstract] [Full Text]
X: Xu, Bo [Abstract] [Full Text]
Y: Yu, Guang-Yao [Abstract] [Full Text]
Z: Zhande, Rachel [Abstract] [Full Text]; Zhang, Tong [Abstract] [Full Text]; Zhang, Yongxin [Abstract] [Full Text]; Zheng, X. F. Steven [Abstract] [Full Text]